Latent Damage in CMOS Devices from Single-Event Latchup
نویسندگان
چکیده
Latent damage effects from single-event latchup are studied, revealing a previously unconsidered reliability hazard for CMOS devices. Several device types were found to remain functional despite significant structural damage to their interconnects from SEL. Latent Damage in CMOS Devices from Single-Event Latchup Heidi N. Becker, Tetsuo F. Miyahira, and Allan H. Johnston Jet Propulsior? Laboratory, California Institute of Techzology Pasadena, Califomia
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